Force Sensing in Scanning Tunneling Microscopy

The observation of interaction forces on an atomic scale is discussed. We show that the sensitivity is essentially limited by thermal fluctuations and by instabilities which can arise for attractive interaction potentials. An experiment was designed in order to explore the forces acting between tunnel tip and sample during scanning tunneling microscopy (STM). Force gradients were detected as resonance shifts of cantilever beams used as sample stage. Beam deflections caused by force variations were also recorded. We present data for tungsten tips and polycrystalline silver surfaces prepared under UHV conditions. Large positive force gradients were found for the range of tunnel distances investigated. Force maps show pronounced features correlating directly with topographic structures.

By: U. Durig, J. K. Gimzewski, D. W. Pohl, R. Schlittler

Published in: RZ1523 in 1986

LIMITED DISTRIBUTION NOTICE:

This Research Report is available. This report has been submitted for publication outside of IBM and will probably be copyrighted if accepted for publication. It has been issued as a Research Report for early dissemination of its contents. In view of the transfer of copyright to the outside publisher, its distribution outside of IBM prior to publication should be limited to peer communications and specific requests. After outside publication, requests should be filled only by reprints or legally obtained copies of the article (e.g., payment of royalties). I have read and understand this notice and am a member of the scientific community outside or inside of IBM seeking a single copy only.

RZ1513.pdf

Questions about this service can be mailed to reports@us.ibm.com .